If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Akhil Sharma is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 5 Similar Profiles
Atomic layer deposition Chemical Compounds
Plasmas Chemical Compounds
Thickness control Chemical Compounds
Gallium Chemical Compounds
Indium Chemical Compounds
Thin film transistors Chemical Compounds
Thin films Chemical Compounds
Platinum Chemical Compounds

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 2015 2019

  • 78 Citations
  • 7 Article
  • 1 Phd Thesis 1 (Research TU/e / Graduation TU/e)

The origin of high activity of amorphous MoS2 in the hydrogen evolution reaction

Wu, L., Longo, A., Dzade, N. Y., Sharma, A., Hendrix, M., Bol, A., de Leeuw, N. H., Hensen, E. & Hofmann, J. P., 2019, (Accepted/In press) In : ChemSusChem. 12, p. 4383-4389

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
Gibbs free energy
precious metal

Atomic layer deposition for 2-D materials beyond graphene

Sharma, A., 12 Dec 2018, Eindhoven: Technische Universiteit Eindhoven. 189 p.

Research output: ThesisPhd Thesis 1 (Research TU/e / Graduation TU/e)Academic

14 Citations (Scopus)

Low-temperature plasma-enhanced atomic layer deposition of 2-D MoS2: Large area, thickness control and tuneable morphology

Sharma, A., Verheijen, M. A., Wu, L., Karwal, S., Vandalon, V., Knoops, H. C. M., Sundaram, R. S., Hofmann, J. P., Kessels, W. M. M. & Bol, A. A., 14 May 2018, In : Nanoscale. 10, 18, p. 8615-8627 13 p.

Research output: Contribution to journalArticleAcademicpeer-review

Thickness control
Atomic layer deposition
7 Citations (Scopus)
Open Access
tungsten oxides
Atomic layer deposition
atomic layer epitaxy
Oxide films
13 Citations (Scopus)

Tuning material properties of oxides and nitrides by substrate biasing during plasma-enhanced atomic layer deposition on planar and 3D substrate topographies

Faraz, T., Knoops, H. C. M., Verheijen, M. A., Van Helvoirt, C. A. A., Karwal, S., Sharma, A., Beladiya, V., Szeghalmi, A., Hausmann, D. M., Henri, J., Creatore, M. & Kessels, W. M. M., 18 Apr 2018, In : ACS Applied Materials & Interfaces. 10, 15, p. 13158-13180 23 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
Atomic layer deposition
Materials properties