• Groene Loper 19, Flux

    5612 AP Eindhoven

    Netherlands

  • P.O. Box 513, Department of Electrical Engineering

    5600 MB Eindhoven

    Netherlands

Press / Media

Stacked dies to connect with test equipment

Erik Jan Marinissen

3/02/20

1 item of Media coverage

Press/Media: Expert Comment

Test Access Opened to Every Die in 3D IC Stack

Erik Jan Marinissen

31/01/20

1 item of Media coverage

Press/Media: Expert Comment

IEEE 1838 Allows Test Access to Every Die in 3D IC Stack

Erik Jan Marinissen

28/01/20

1 item of Media coverage

Press/Media: Expert Comment

Stacked package standard for IEEE Xplore Digital Library

Erik Jan Marinissen

28/01/20

1 item of Media coverage

Press/Media: Expert Comment

Testing stacked dies in 3D integrated circuits

Erik Jan Marinissen

27/01/20

2 items of Media coverage

Press/Media: Expert Comment

Testing stacked dies in 3D integrated circuits ..

Erik Jan Marinissen

27/01/20

2 items of Media coverage

Press/Media: Expert Comment

1838-2019 test standard for 3D chips adds parallel operation

Erik Jan Marinissen

27/01/20

1 item of Media coverage

Press/Media: Expert Comment

Organizing the Second International Workshop of Computer Vision for Physiological Measurement on ICCV 2019

Wenjin Wang, Daniel McDuff & S. Stuijk

28/10/19

1 Media contribution

Press/Media: Public Engagement Activities

Organizing the special issue of "Camera-Based Monitoring for Pervasive Healthcare Informatics" on IEEE-JBHI (Impact factor: 4.217)

Wenjin Wang, Steffen Leonhardt, Lionel Tarassenko, Caifeng Shan & Daniel McDuff

25/10/19

1 Media contribution

Press/Media: Public Engagement Activities

Organizing an invited session of optical health monitoring on EMBC 2019

Wenjin Wang, Hubin Zhao & S. Stuijk

26/07/19

1 Media contribution

Press/Media: Public Engagement Activities

Book Review: Handbook of 3D Integration – Volume 4

Erik Jan Marinissen

23/05/19

1 item of Media coverage

Press/Media: Expert Comment

3D Test: No Longer a Bottleneck!

Erik Jan Marinissen & Hailong Jiao

15/05/19

1 item of Media coverage

Press/Media: Expert Comment

imec, TU Eindhoven, and Cadence – Advances in Defect Location Identification

Zhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos Huisken & Kees Goossens

7/05/19

1 Media contribution

Press/Media: Expert Comment

Best Paper Award at LATS2019 for Zhan Gao

Zhan Gao & Erik Jan Marinissen

3/04/19

1 item of Media coverage

Press/Media: Research