Department of Electrical Engineering

Press / Media

Stock Weekly: Yuanta Financial drops 2.9% on robust volume

W. Chen

1/04/20

1 item of Media coverage

Press/Media: Expert Comment

Stock Weekly: Yuanta Financial in its biggest weekly gain in 8 months

W. Chen

27/03/20

1 item of Media coverage

Press/Media: Expert Comment

Innovative New Fabrication Approach For Reprogrammable Photonic Circuits

Oded Raz

26/03/20

1 item of Media coverage

Press/Media: Expert Comment

Stock Weekly: Yuanta Financial tumbles 12.4%

W. Chen

20/03/20

1 item of Media coverage

Press/Media: Expert Comment

Innovative new fabrication approach for reprogrammable photonic circuits

Oded Raz & B. Fitzgerald

20/03/20

3 items of Media coverage

Press/Media: Expert Comment

Behind the Scenes of IEEE Std 1838™-2019

Erik Jan Marinissen

19/03/20

1 item of Media coverage

Press/Media: Expert Comment

An Inside Look at 3D-DfT Standard IEEE Std 1838™-2019

Erik Jan Marinissen

17/03/20

1 item of Media coverage

Press/Media: Expert Comment

Stock Weekly: Yuanta Financial tumbles 8.7%

W. Chen

13/03/20

1 item of Media coverage

Press/Media: Expert Comment

Stock Weekly: Yuanta Financial decreases 0.8% on robust volume

W. Chen

6/03/20

1 item of Media coverage

Press/Media: Expert Comment

Rice University: Small Step for Atoms, Giant Leap for Microelectronics

W. Chen

5/03/20

1 item of Media coverage

Press/Media: Expert Comment

Researchers Successfully Grow Atom-Thick Sheets of Hexagonal Boron Nitride

W. Chen

5/03/20

1 item of Media coverage

Press/Media: Expert Comment

A small step for atoms, a giant leap for microelectronics

W. Chen

4/03/20

4 items of Media coverage

Press/Media: Expert Comment

Published Paper in Nature Communications

Alex Alvarado

3/03/20

1 item of Media coverage

Press/Media: Expert Comment

Intel Joins CHIPS Alliance; 3D Stack Testing Standardized

Erik Jan Marinissen

3/03/20

1 item of Media coverage

Press/Media: Expert Comment

Human resource of ima 2020 6

Tiago Castelo de Oliveira

1/03/20

1 item of Media coverage

Press/Media: Expert Comment