X-ray diffractometer (XRD), PanAlytical

    Beatriz Barcones Campo (Manager)

Facility/equipment: Equipment

    Equipments Details

    Description

    High Resolution X-Ray Diffraction for the analysis of phase composition, thickness, roughness and defects in the thin layers. Applied also for the analysis of polycrystalline and disordered materials and for analysis of artificial structures.
    Photo associated with equipment

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