Details
Description
The Phenom ProX is an instrument optimally suited for imaging and elemental analysis of a wide range of materials. It is a table top scanning electron microscope equipped with an CeB6 electron source, a secondary electron (SE), a back scatter (BSE) and an energy dispersive X-Ray (EDX) detector and can be operated at acceleration voltages of 5, 10 and 15 kV.
A special sample holder for non-conductive samples is available.
The Phenom ProX is used to study the morphology and composition of a wide range of samples, including composites, coatings, porous materials, and catalysts.
A special sample holder for non-conductive samples is available.
The Phenom ProX is used to study the morphology and composition of a wide range of samples, including composites, coatings, porous materials, and catalysts.
Details
| Name | Scanning Electron Microscope: Phenom ProX |
|---|---|
| Acquisition date | 1/01/17 |
| Manufacturers | Thermo Fisher Scientific |
×
![]()
Fingerprint
Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.