Ion Analyzer LEIS

    H.H. Brongersma (Manager)

Facility/equipment: Equipment

  • Location

    Netherlands

Equipments Details

Description

Surface analysis equipment for the outermost atomic layer of a test sample. A system of electromagnetic lenses fires inert gas ions at the material under investigation. The energy spectrum of the rebounding ions is measured and this energy spectrum can be interpreted as a mass spectrum for the sample surface.
Photo associated with equipment

Details

NameIon Analyzer LEIS
ManufacturersEquipment & Prototype Center

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