Ion Analyzer LEIS

  • H.H. Brongersma (Manager)

Facility/equipment: Equipment

  • Location


Equipments Details


Surface analysis equipment for the outermost atomic layer of a test sample. A system of electromagnetic lenses fires inert gas ions at the material under investigation. The energy spectrum of the rebounding ions is measured and this energy spectrum can be interpreted as a mass spectrum for the sample surface.


NameIon Analyzer LEIS
ManufacturersEquipment & Prototype Center


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