XRD measurements are performed on the Bruker D8 Advance diffractometer with Parallel beam optics, Gobel mirror, using copper radiation at 40kV and 40mA. The samples can be prepared on several sample holders, whereby the machine is equiped with an Eulerian Cradle which makes it possible to move and rotate the sample in several directions. The system can be used to determine crystal structures, in transmission and reflection mode. Furthermore, the system can be used for thin film analysis by grazing incidence and reflectometry.
|Name||Bruker D8 Advance X-Ray diffractometer|
|Manufacturers||Bruker Nano GmbH|
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