Replication Data for: "SMaRT Stacking: a Methodology to Produce Optimally Layered EMI Shields with Maximal Green Index using Fused Deposition Modeling"

Measurements of S-parameters obtained with a Vector Network Analyzer (VNA) in the X-band frequency range (8 - 12 GHz) to train the permittivity function of PLA/MWCNT nanocomposites produced via Fused Deposition Modeling (FDM).
VNA measurements of the optimal stacks are also included.