WIPO PUBLISHES PATENT OF TECHNISCHE UNIVERSITEIT EINDHOVEN FOR "EXTREME SCANNING FOCAL-PLANE ARRAYS USING A DOUBLE-REFLECTOR CONCEPT WITH UNIFORM ARRAY ILLUMINATION" (DUTCH INVENTORS)

Press/Media: Expert Comment

Period15 Sep 2019

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Media coverage

  • TitleWIPO PUBLISHES PATENT OF TECHNISCHE UNIVERSITEIT EINDHOVEN FOR "EXTREME SCANNING FOCAL-PLANE ARRAYS USING A DOUBLE-REFLECTOR CONCEPT WITH UNIFORM ARRAY ILLUMINATION" (DUTCH INVENTORS)
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date15/09/19
    PersonsAleksei Dubok, Ali Al-Rawi
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