WIPO PUBLISHES PATENT OF NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO FOR "METHOD OF AND SYSTEM FOR DETERMINING AN OVERLAY OR ALIGNMENT ERROR BETWEEN A FIRST AND A SECOND DEVICE LAYER OF A MULTILAYER SEMICONDUCTOR DEVICE" (D

Press/Media: Expert Comment

Period25 Jul 2018

Media coverage

1

Media coverage

  • TitleWIPO PUBLISHES PATENT OF NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO FOR "METHOD OF AND SYSTEM FOR DETERMINING AN OVERLAY OR ALIGNMENT ERROR BETWEEN A FIRST AND A SECOND DEVICE LAYER OF A MULTILAYER SEMICONDUCTOR DEVICE" (D
    Media name/outletUS Fed News
    CountryUnited States
    Date25/07/18
    PersonsHamed Sadeghian Marnani