US Patent Issued to Tsinghua University, HON HAI PRECISION INDUSTRY on June 1 for "Method for designing a freeform surface reflective imaging system" (Chinese Inventors)

Press/Media: Expert Comment

Period2 Jun 2021

Media coverage

1

Media coverage

  • TitleUS Patent Issued to Tsinghua University, HON HAI PRECISION INDUSTRY on June 1 for "Method for designing a freeform surface reflective imaging system" (Chinese Inventors)
    Media name/outletUS Fed News
    CountryUnited States
    Date2/06/21
    PersonsWei Chen