US Patent Issued to Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO on Sept. 15 for "Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semico

Press/Media: Expert Comment

Period16 Sep 2020

Media coverage

1

Media coverage

  • TitleUS Patent Issued to Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO on Sept. 15 for "Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semico
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date16/09/20
    PersonsHamed Sadeghian Marnani