US Patent Issued to Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO on June 8 for "Method of and system for detecting structures on or below the surface of a sample using a probe including a cantilever and a probe tip" (Dutch I

Press/Media: Expert Comment

Period9 Jun 2021

Media coverage

1

Media coverage

  • TitleUS Patent Issued to Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO on June 8 for "Method of and system for detecting structures on or below the surface of a sample using a probe including a cantilever and a probe tip" (Dutch I
    Media name/outletUS Fed News
    CountryUnited States
    Date9/06/21
    PersonsHamed Sadeghian Marnani