Tsinghua University and Hon Hai Precision Industry Granted United States Patent for Method for Designing a Freeform Surface Reflective Imaging System

Press/Media: Expert Comment

Period1 Jun 2021

Media coverage

1

Media coverage

  • TitleTsinghua University and Hon Hai Precision Industry Granted United States Patent for Method for Designing a Freeform Surface Reflective Imaging System
    Media name/outletGlobal IP News. Optics & Imaging Patent News
    CountryIndia
    Date1/06/21
    PersonsWei Chen