Test Access Opened to Every Die in 3D IC Stack

Press/Media: Expert Comment

Period	31 Jan 2020

Media coverage

Title	Test Access Opened to Every Die in 3D IC Stack
Media name/outlet	EE Times India
Country	India
Date	31/01/20
URL	www.eetindia.co.in/news/article/Test-Access-Opened-to-Every-Die-in-3D-IC-Stack
Persons	Erik Jan Marinissen