Stacked dies to connect with test equipment

Press/Media: Expert Comment

Period	3 Feb 2020

Media coverage

Title	Stacked dies to connect with test equipment
Media name/outlet	Electronic Specifier
Country/Territory	United Kingdom
Date	3/02/20
URL	https://www.electronicspecifier.com/industries/stacked-dies-to-connect-with-test-equipment
Persons	Erik Jan Marinissen