Shenzhen Inst of Adv Tech CAS Submits Patent Application for Image Quality Measurement Method and Device

Press/Media: Expert Comment

Period22 Apr 2018

Media coverage

1

Media coverage

  • TitleShenzhen Inst of Adv Tech CAS Submits Patent Application for Image Quality Measurement Method and Device
    Media name/outletGlobal IP News. Measurement & Testing Patent News
    CountryIndia
    Date22/04/18
    PersonsFan Wu