New technique measures near-perfect performance in low-cost semiconductors

Press/Media: Expert Comment

Period	19 Mar 2019

Media coverage

Title	New technique measures near-perfect performance in low-cost semiconductors
Media name/outlet	Technische Universiteit Eindhoven
Country/Territory	Netherlands
Date	19/03/19
URL	https://www.tue.nl/en/news/news-overview/19-03-2019-new-technique-measures-near-perfect-performance-in-low-cost-semiconductors/
Persons	Yoeri B. van de Burgt