New integrated device for nanometer-scale sensing

Press/Media: Expert Comment

Period	19 May 2020

Media coverage

Title	New integrated device for nanometer-scale sensing
Media name/outlet	Technische Universiteit Eindhoven
Country	Netherlands
Date	19/05/20
URL	ct.moreover.com/?a=42151234578&p=1gw&v=1&x=eBz4-ThnpBcgXdX4fhLx9Q
Persons	Andrea Fiore