imec, TU Eindhoven, and Cadence - Advances in Defect Location Identification

Electronic Systems

Press/Media: Expert Comment

Description

Zhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.

Period	30 May 2019

Media contributions

1

Media contributions

Title	imec, TU Eindhoven, and Cadence – Advances in Defect Location Identification & Making Cell Aware Test Accessible for Production Use
Degree of recognition	International
Media name/outlet	Cadence Multimedia Channel
Media type	Web
Duration/Length/Size	3:18
Country/Territory	United States
Date	30/05/19
Description	Zhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.
Producer/Author	Cadence Design Systems
URL	https://www.cadence.com/content/cadence-www/global/en_US/home/multimedia.html.html/content/dam/cadence-www/global/en_US/videos/tools/digital_design_signoff/imec-modus-atpg.mp4
Persons	Zhan Gao, Erik Jan Marinissen

Conference

Title	Cadence User Meeting
Location	Infinity Hotel, Munich, Bavaria, Germany
Period	6 May 2019 → 8 May 2019
Link	https://www.cadence.com/content/cadence-www/global/en_US/home/cdnlive/emea-2019.html