imec, TU Eindhoven, and Cadence – Advances in Defect Location Identification

Press/Media: Expert Comment

Description

Zhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.

Period7 May 2019

Media contributions

1

Media contributions

  • TitleAdvanced in Defect Location Identification
    Degree of recognitionInternational
    Media name/outletYoutube.com - channel Cadence Design Systems
    Media typeWeb
    Duration/Length/Size3min 18sec
    CountryUnited States
    Date7/05/19
    DescriptionZhan Gao discusses the collaboration between imec, TU Eindhoven, and Cadence, which results in a 97.2% reduction in simulation time for cell aware test, and is available in the most recent Modus ATPG release.
    Producer/AuthorCadence Design Systems
    URLhttps://www.youtube.com/watch?v=NtwfesYdz90
    PersonsZhan Gao, Santosh Malagi, Erik Jan Marinissen, Joe Swenton, Jos A. Huisken, Kees G.W. Goossens