Enabling Test Strategies For 2.5D, 3D Stacked ICs

Press/Media: Expert Comment

Period	8 Sept 2022

Media coverage

Title	Enabling Test Strategies For 2.5D, 3D Stacked ICs
Media name/outlet	Semiconductor Engineering
Country/Territory	United States
Date	8/09/22
URL	https://semiengineering.com/enabling-test-strategies-for-2-5d-3d-stacked-ics/
Persons	Erik Jan Marinissen