Eindhoven University of Technology Reports Findings in Information Technology (Data-driven Aggregate Modeling of a Semiconductor Wafer Fab To Predict Wip Levels and Cycle Time Distributions)

Media coverage

• Title	Eindhoven University of Technology Reports Findings in Information Technology (Data-driven Aggregate Modeling of a Semiconductor Wafer Fab To Predict Wip Levels and Cycle Time Distributions)
  Media name/outlet	Information Technology Daily
  Country/Territory	United States
  Date	17/07/23
  URL	ct.moreover.com/?a=51321837099&p=1gw&v=1&x=t_-alEcJfoP60rykPiskWQ
  Persons	Ivo J.B.F. Adan, Alp Akcay, Jeroen Middelhuis