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Dutch Model Checking Day, Delft
Voeten, J.
(Invited speaker)
Electronic Systems
Activity
:
Talk or presentation types
›
Invited talk
›
Scientific
Description
Performance prediction and optimization for wafer scanners
Period
17 Jun 2011
Event title
Dutch Model Checking Day, Delft
Event type
Conference
Documents & Links
http://purl.tue.nl/376545709418326